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2008 IEEE International Ultrasonics Symposium (IUS)
Beijing International Convention Center (BICC)
Beijing, China, November 2-5, 2008 (Please click: Beijing Photos )

Sponsored by the IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society

In Cooperation with the Acoustical Society of China and the Institute of Acoustics, Chinese Academy of Sciences

(There have been - - visits since July 1, 2008)

Meeting Planner (Opened August 13, 2008)

Reminders for Conference Attendees:

• Visa Application: For attendees who need a visa to enter China should request an official Letter of Invitation via the link "Visa Application" on the left pane of the conference website: http://ewh.ieee.org/conf/ius_2008/. This letter is necessary when you apply for a visa. The United States nationals and people from many countries need a visa to enter China. Please prepare your visa application documents early since more documents than normal may be required due to the Beijing Olympics. Please notice that the deadline for you to request the Letter of Invitation is: Tuesday, September 30, 2008.
• Hotel Reservation: Rooms of a group of hotels with discount rates have been blocked for attendees of the 2008 IEEE International Ultrasonics Symposium. These hotels are within the walking distance from the conference venue, the Beijing International Convention Center (BICC). Please notice that Monday, September 15, 2008 is the absolute deadline after which none of the hotels would guarantee to honor the discount rates. Please follow the link "Conference Hotels" to book hotels. All hotels are reserved on the "first come, first serve" basis. The number of rooms available in the hotel (Continental Grand) that is connected to BICC is decreasing fast. Attendees who could not find a suitable room in these hotels could take advantage of some rooms vacated by the hundreds of thousands of Olympic visitors through new subway routes, Lines #8, #10, #5, and Airport Lines, that are built for the Olympics and connect BICC to the Center of Beijing.
• Conference Registration: Please notice that the deadline for getting discounted (early) registration rates is: Friday, September 12, 2008. Please follow the link "Conference Registration" to register for the conference.
• Technical Program of the Conference: The Condensed Program, Full Program (Program Book), and Abstract Book are now available.

Meeting Planner:

The Meeting Planner will help attendees to personalize or individualize their conference programs. The individualized programs can be printed out and brought to the conference. Combined with the Condensed Program and the Floor Plan, it would make it easier for attendees to navigate through the conference. Attendees could also check the Full Program (Program Book) and/or the Abstract Book for the entire program. (Please notice that the Floor Plan not only shows the locations of rooms, but also contains a map of the location of each poster with a serial number. The serial number, such as "003", is also contained in the poster label, such as PS003-03, whose meaning is described in detail in the "Poster Presentation Guide".)

Note: The deadline, Friday, August 1, 2008, to resolve with your employers or any other concerned body for any intellectual property rights of the researches in the abstracts (please see "Abstract Results" for detail) has passed. The Meeting Planner is now available below, allowing an access to the abstracts.

If you have submitted an abstract through our "Abstract Submission" website, your user name and password created there will be the same for the Meeting Planner. If you forget your user name and password, you could get them by clicking on "I forgot my password". If you do not have user name and password, you can create them through the "New User" button. (Please REFRESH your browser now to view an updated page that contains correct links!)

          Attendee Meeting Planner:  http://submissions.miracd.com/ius2008/Itinerary
               Questions on Meeting Planner: Phone: (866)341-9589; Email: IUS2008@mirasmart.com

Condensed Technical Program and Some Statistics:

© Copyright 2006-2008 IEEE UFFC Society