| In the area of process control, non-destructive testing (NDT) using ultrasound is valuable due to its noninvasive properties. In process control, imaging of surface profiles is used to locate defects or problematic areas in order to quickly steer the manufacturing process on track again. This paper presents a method for imaging of parallel thin layers within multi-layered structures. Due to the application in process control a parametric model is used, and all subsequent analysis is performed on the model parameters rather than on the signal waveforms, resulting in a necessary data reduction. The parameters in the model are directly connected to physical properties, such as the reflection coefficients, time-of-flights, and attenuation coefficients. Experimental results shows that the estimated model parameters can be used in imaging of thin layer properties within the material structure. Images of embedded layers with a thickness about the wavelength is shown. Result also show that flaws can be detected in such structures. The results are verified by comparing the images to visual inspections of photographs. |