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Technology & Networking in Silicon Valley & the SF Bay Area: Upcoming Meetings, Courses and Conferences

August 30, 2016

CPI Stress Induced Carrier Mobility Shift in Advanced Silicon Nodes

by @ 10:26 pm. Filed under ALL, Electronics Design, Reliability, Semiconductors
 

Thursday, November 3, 2016
SCV Reliability Chapter, Electron Device Society (EDS), and Components, Packaging, and Manufacturing Technologies (CPMT) 
Subject: CPI Stress Induced Carrier Mobility Shift in Advanced Silicon Nodes
– mechanical stress and the consequent effects on device performance for advanced three-dimensional (3-D) IC technologies …
Speaker: Valeriy Sukharev, Technical Lead, Design to Silicon Division (Calibre) of Mentor Graphics Corporation
Time: 6:00 to 6:30 pm: Sign in, snacks and social; 6:30 to 7:30 pm: Presentation; 7:30 to 8:00 pm: Question and Answer Session
Cost: Free
Location: Qualcomm, Inc., 3165 Kifer Road, Santa Clara, in the cafeteria
Event Details: http://ewh.ieee.org/r6/scv/rl/
Please register so as to know how much food to purchase: https://www.eventbrite.com/e/cpi-stress-induced-carrier-mobility-shift-in-advanced-silicon-nodes-tickets-27427049042
Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.com

20161103ALL

Reliability and The Self-Driving Car

by @ 10:15 pm. Filed under ALL, Electronics Design, Reliability
 

Thursday, October 6, 2016
SCV Reliability Chapter
Subject: Reliability and The Self-Driving Car
– 94% of traffic accidents involve human error, developing a self-driving vehicle from the ground up, and employing the best design for reliability and reliability test practices…
Speaker: Noah Lassar, Senior Manager of Reliability for the Google[X] Self-Driving Car
Time: 6:00 to 6:30 pm: Sign in, snacks and social; 6:30 to 7:30 pm: Presentation; 7:30 to 8:00 pm: Question and Answer Session
Cost: Free
Location: Qualcomm, Inc., 3165 Kifer Road, Santa Clara, in the cafeteria
Event Details: http://ewh.ieee.org/r6/scv/rl/
Please register so as to know how much food to purchase: https://www.eventbrite.com/e/reliability-and-the-self-driving-car-tickets-27426937709
Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.com

20161006ALL

August 18, 2016

A Statistical FEA Method for Predicting Glass Fracture in Consumer Electronic Products

by @ 10:19 pm. Filed under ALL, Consumer Electronics, Electronics Design, Reliability
 

Thursday, August 25, 2016
SCV Signal Processing Society (SPS)
Subject: A Statistical FEA Method for Predicting Glass Fracture in Consumer Electronic Products
– probability of fracture for glass components during drop impact, size and rate effects on glass strength, the temporal and spatial nature of the stress results, and the combining of drop orientations to produce a probability of failure …
Speaker: Marc Zampino, Senior Design Analysis Engineer, Amazon/Lab126
Time: 6:00 pm: Registration, networking, and refreshments; 6:30 pm to 7:30 pm: Presentation; 7:30 to 8:00 pm: Question and answer session
Cost: Free, Donations accepted for food
Location: Qualcomm Inc., in the Cafeteria, 3165 Kifer Rd, Santa Clara
Event Details: http://ewh.ieee.org/r6/scv/rl/
RSVP to know how much food to purchase: https://www.eventbrite.com/e/a-statistical-fea-method-for-predicting-glass-fracture-in-consumer-electronic-products-tickets-27186020118
Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, http://www.icenginc.com

20160901ALL

July 12, 2016

Surfaces, Interfaces, and Microelectronic Packaging

by @ 10:35 pm. Filed under ALL, Reliability, Semiconductors
 

Thursday, August 4, 2016
SCV Reliability Chapter and SCV Components, Packaging, and Manufacturing Technologies (CPMT)
Subject: Surfaces, Interfaces, and Microelectronic Packaging
– interfacial interactions between Pb-free solders and substrates, the nature of these interactions, the intermetallic compounds (IMC) that are formed, and how these interaction change with time …
Speaker: Dr. Guna Selvaduray, Ph.D.
Time: 6:00 pm: Introductions and Networking; 6:30 to 8:30 pm: Presentation and Question and Answer Session
Cost: Free
Location: Qualcomm, 3165 Kifer Road, Santa Clara

Event Details: http://ewh.ieee.org/r6/scv/rl/
RSVP: https://scvrelaug2016.eventbrite.com

20160804ALL

June 27, 2016

Tesla Model S Battery, Charger, and Drive-Unit Reliability

by @ 11:24 am. Filed under ALL, Reliability
 

Wednesday, July 13, 2016
SCV Reliability Chapter
Subject: Tesla Model S Battery, Charger, and Drive-Unit Reliability
– nonparametric estimates of reliability, including bivariate, for our education, to dispel some reliability mythology …
Speaker: Dr. Larry George, Reliability Statistician
Time: 6:00 pm: Introductions and Networking; 6:30 to 7:30 pm: Presentation; 7:30 to 8:00 pm: Question and Answer Session
Cost: Free
Location: Applied Materials, Bowers Cafe (aka Campus Cafe), 3090 Bowers Ave., Santa Clara
RSVP: Please send an RSVP to Dr. John Flaig at least two days prior to the meeting if you plan to attend: johnflaig@yahoo.com, subject=Please Reserve My Seat for Taking practical steps towards Designing-for-Reliability
Event Details: http://ewh.ieee.org/r6/scv/rl/index.html
Co-sponsored with The ASQ Silicon Valley Statistics and Reliability Discussion Group

20160713ALL

June 17, 2016

Hot Chips 28: A Symposium on High Performance Chips

by @ 4:16 pm. Filed under ALL, Computers/Software, Electrical/Power, Electronics Design, Product Safety, Reliability, Semiconductors
 

Hot Chips 28: A Symposium on High Performance Chips will be held at the Flint Center in Cupertino on Sunday, August 21 through Tuesday, August, 23 , with tutorials on Sunday.

HotChipsPerformance, innovation, and advanced technology; come to the symposium which specializes in processors, mobile and embedded devices, communications and networking, FPGAs, memory, chipsets, high integrity computation, and power chips. Software, packaging and test, displays, optical and sensors, and other novel devices will also be showcased.

For more information, go to http://www.hotchips.org. Also see the Hot Chips 2016 Advance Program.pdf

 

20160821ALL

Hot Interconnects Symposium

by @ 4:14 pm. Filed under ALL, Computers/Software, Electrical/Power, Electronics Design, Product Safety, Reliability, Semiconductors
 

Calling the Data-Center Networking and the Supercomputing communities! Come to the Hot Interconnects Symposium at the Huawei North America Headquarters in Santa Clara on August 24-25.

Hot Interconnects
IEEE Hot Interconnects is the premier international forum for researchers and developers of state-of-the-art hardware and software architectures and implementations for interconnection networks of all scales, ranging from multi-core on-chip interconnects to those within systems, clusters, and data centers. Leaders in industry and academia attend the conference to interact with individuals at the forefront of this field. http://www.hoti.org

 

 

 

20160824ALL

May 6, 2016

Taking Practical Steps Towards Designing-for-Reliability

by @ 8:39 pm. Filed under ALL, Reliability
 

Wednesday, May 11, 2016
SCV Reliability Society and ASQ Silicon Valley Statistics and Reliability Discussion Group
Subject: Taking Practical Steps Towards Designing-for-Reliability
– problems are identified and addressed upstream in the product development process instead of being detected in late testing or in the field …
Speaker: Georgios Sarakakis, Senior Manager of Reliability Engineering, Tesla Motors
Time: 6:00 pm: Networking and Introductions; 6:30 pm: Presentation; 7:30 to 8:00 Q&A
Cost: Free
Location: Applied Materials Bowers Cafe (aka Campus Cafe), 3090 Bowers, Santa Clara
Event Details: http://ewh.ieee.org/r6/scv/rl/index.htm

20160511ALL

May 1, 2016

Designing with FinFETs

by @ 2:09 pm. Filed under ALL, Reliability, Semiconductors, Signal Processing
 

Tuesday, May 10, 2016
SCV Electron Device Society (EDS)
Subject: Designing with FinFETs
-multigate transistor, microprocessor product at 22nm node, Fin formation, metrology, device parasitics, performance as well as design challenges for logic and SRAM circuits …
Speaker: Dr. Witold (Witek) P. Maszara, Distinguished Member of Technical Staff, Global Foundries
Time: 6:00 pm: Networking and refreshments; 6:15 pm to 7:00 pm: Presentation
Cost: Free
Location: Texas Instruments Building E Conference Center, 2900 Semiconductor Dr., Santa Clara
Event Details: http://sites.ieee.org/scv-eds/

20160510ALL

April 19, 2016

Understanding Maxwellâ??s Equationâ??EMC Made Simple

by @ 3:13 pm. Filed under ALL, Magnetics, Reliability
 

Tuesday, May 10, 2016
SCV Electromagnetic Compatibility (EMC)
Subject: Understanding Maxwellâ??s Equationâ??EMC Made Simple
– what “Maxwell tell us”, locate the problem area quickly and at low cost, a unique way of understanding field propagation, easily converted into five simple algebraic equations…
Speaker: Mark Montrose, Montrose Compliance Services
Time: 5:30 pm to 6:30 pm: Light Dinner; 6:30 pm to 7:30 pm: Presentation
Cost: Free
Location: 7Layers, 1293 Anvilwood Ave., Sunnyvale
Event Details and Registration: http://www.scvemc.org/

20160510ALL

March 11, 2016

BACL: Lecture + Facility Tour, Bay Area Compliance Laboratories Corp.

by @ 8:23 pm. Filed under ALL, Product Safety, Reliability
 

Wednesday, March 23, 2016 
SCV Product Safety Engineering Society (PSES) 
Subject: BACL: Lecture + Facility Tour, Bay Area Compliance Laboratories Corp. 
– tour of their facility, a presentation of their services, recently added the lighting lab to enable them to do Photometric measurements… 
Time: 6:30 pm to 8:00 pm, Pizza and drinks included 
Cost: Free
Location: Bay Area Compliance Laboratories Corp. 1274 Anvilwood Ave., Sunnyvale 
Event Details: http://ewh.ieee.org/r6/scv/pses/

20160323ALL

February 15, 2016

Physics-Based Life Distribution and Reliability Modeling of Solid State Drives

by @ 11:45 am. Filed under ALL, Reliability
 

Thursday, March 3, 2016 
SCV Reliability Society 
Subject: Physics-Based Life Distribution and Reliability Modeling of Solid State Drives 
– When only field write duty cycle is treated as a random variable, SSD life time follows, analytic solution exists when both random variables follow Lognormal distribution … 
Speaker: Alexander Parkhomovsky, Ph.D. 
Time: 6:00 to 6:30 pm: Registration, snacks, and networking; 6:30 to 7:30 pm: Presentation 
Cost: Free 
Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, in the cafeteria 
Event Details and Registration: http://www.ewh.ieee.org/r6/scv/rl/ 
Registration: https://www.eventbrite.com/e/physics-based-life-distribution-and-reliability-modeling-of-solid-state-drives-ssds-tickets-21595167728 
Food sponsored by: I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.com

20160303ALL

January 26, 2016

Fracture Mechanics & Fatigue: Theory and Modeling for Mechanical Engineers

by @ 11:23 am. Filed under ALL, Electronics Design, Reliability
 

Saturday, January 30, 2016 
SCV Reliability Society 
Subject: Fracture Mechanics & Fatigue: Theory and Modeling for Mechanical Engineers 
– This course covers detailed information on the Fracture Mechanics and Fatigue theory as well as numerical modeling. The course reviews the fundamentals of fracture mechanics and fatigue…
Speaker: Dr. Metin Ozen, ASME Fellow, Principal, Ozen Engineering Inc. 
Co-sponsored by: ASME SCV Chapter 
Time: 9:00 am to 4:00 pm 
Cost: ASME or IEEE Member: $80 per person, Non-Member: $120 per person. Student, Unemployed or Retired Member: $45 per person. 
All in-person attendees will receive a light lunch. Breaks with snacks and drinks will be part of the seminar experience. 
Location: Santa Clara University, 500 El Camino Real, Santa Clara
Event Details: http://ewh.ieee.org/r6/scv/rl/

20160130ALL

January 14, 2016

Failure Modes of Varistors and How to Protect Against This Problem

by @ 12:49 pm. Filed under ALL, Electrical/Power, Electronics Design, Industrial Applications, Reliability, Semiconductors
 

Wednesday, January 27, 2016 
SCV Product Safety Engineering Society (PSES) 
Subject: Failure Modes of Varistors and How to Protect Against This Problem 
– wear-out mechanisms and failure modes created by continuous overvoltage conditions, induced voltage spikes, electrical disturbances from the outdoor environment … 
Speaker: Bharat Shenoy, Littelfuse 
Time: 6:30 to 7:00 pm: Networking & Pizza; 7:00 to 8:00 pm: Presentation 
Cost: Free 
Location: Electronic Cooling Solutions, Inc., 2915 Copper Road, Santa Clara 
Event Details: http://www.eventbrite.com/e/ieee-scv-pses-jan-2016-meeting-tickets-20791543065/

20160127ALL

December 12, 2015

Beyond Balloons: Enabling Soft Robotics with new Materials and Systems

by @ 10:55 pm. Filed under ALL, Electronics Design, Industrial Applications, Reliability
 

Thursday, December 17, 2015 
SCV Reliability Society 
Subject: Beyond Balloons: Enabling Soft Robotics with new Materials and Systems 
– more mobile, dexterous, versatile, robust and even social, new generation of robotic systems that are based on soft and adaptive materials is emerging, wearable robotic “exosuits”… 
Speaker: Roy Kornbluh, Principal Research Engineer, Robotics Laboratory, SRI International 
Time: 7:00 pm: Presentation 
Cost: Free 
Location: SRI International, Laurel St and Mielke Dr (This an intersection.), Building G (across the street from Menlo Park City Hall), Menlo Park 
Event Details: http://www.meetup.com/IEEE-Robotics-and-Automation-Society/events/227356189/

20151217ALL

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