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April 27, 2008

Mtg: Advancements in Noise Measurement

by @ 7:31 pm. Filed under ALL, Communications, Electronics Design, Engineering Mgmt, Semiconductors
 

WEDNESDAY May 21
SCV Instrumentation and Measurement Chapter
Speaker: Ken Wong, Agilent Technology
Time: Social/refreshments at 6:30, Presentation at 6:45 PM
Cost: none
Place: Board Room, Cogswell College, (1175 Bordeaux Dr, Sunnyvale
RSVP: by email to Brian Lee, Brian.Lee@IEEE.ORG
Web: ewh.ieee.org/r6/scv/ims

 

Noise measurements were developed since the beginning of telecommunication. ? The Y-factor method was introduced back in the 1930’s.? The cold source method was also mentioned at the same time. Noise parameters (more…)

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