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July 29, 2008

Mtg: Electro-Optical Microscopy: Evolution in Component and Package-Level Inspection

by @ 6:14 pm. Filed under ALL, BioEngineering, Electronics Design, NanoEngineering, Optics/Displays, Semiconductors
 

THURSDAY November 20, 2008
SCV Components, Packaging and Manufacturing Technology Chapter
Speaker: Andrew Kominek, Micro Analysis Group, Keyence Corporation
Time: Registration at 11:30 AM, Buffet lunch at 11:45 AM, Presentation at 12:15 PM
Cost: $15 if reserved by Nov. 17; $20 after & at door
Place: Ramada Inn, 1217 Wildwood Ave (Fwy 101 frontage road at Lawrence Expressway), Sunnyvale
RSVP: by email to Ed Aoki, aoki.ed@gmail.com
Web: www.cpmt.org/scv

This presentation introduces digital microscope technology and its application in semiconductor development, failure analysis, and quality control. ? The integration of rapidly advancing digital image processing with slowly improving optical microscopy (more…)

Mtg: Recent Developments in Large Arrays of Microcavity Plasma Devices: Physics and Applications

by @ 8:18 am. Filed under ALL, Communications, NanoEngineering, Optics/Displays, Semiconductors
 

THURSDAY September 18, 2008
SCV Lasers and Electro Optics Chapter
Speaker: Prof. J. Gary Eden, University of Illinois at Urbana-Champaign
Time: Networking and Pizza Social at 6:00 PM; Presentation at 7:00 PM
Cost: none
Place: KLA-Tencor Corporation, 3 Technology Drive, Milpitas
RSVP: through website
Web: www.ewh.ieee.org/r6/scv/leos

Microcavity plasma devices are a new class of hybrid plasma/optoelectronic device in which a non-equilibrium low temperature plasma is spatially confined to a microcavity with a characteristic cross-sectional dimension (more…)

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