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February 20, 2009

Mtg: Design for Reliability (DFR) Approach in the Magnetic Storage Industry

by @ 8:19 am. Filed under ALL, Computers/Software, Electronics Design, Engineering Mgmt
 

WEDNESDAY March 25, 2009
SCV Reliability Chapter
Speaker: Dr. Alexander Parkhomovsky, Seagate Technology
Time: Refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: HP Oak Room, 19447 Pruneridge Avenue (Building 48), Cupertino
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/rl

Significant cost savings in high volume product development and manufacturing were achieved by addressing reliability design flaws early in the stage gate process.? Critical Path Analysis (more…)

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