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August 9, 2010

Tutorial: Status of Knowledge on Non-Binary LDPC Decoders

by @ 7:33 pm. Filed under ALL, Communications, Electronics Design, Engineering Mgmt, Semiconductors
 

THURSDAY October 21, 2010
SCV Solid State Circuits, with Signal Processing, Circuits and Systems, and Communications Chapters
Speaker: Prof. David Declercq, ENSEA in Cergy-Pontoise
Time: Networking and snacks at 5:30 PM; Lecture at 6:00 PM
Cost: $2 donation accepted for food
Place: National Semiconductor Building E Auditorium, 2900 Semiconductor Dr., Santa Clara
RSVP: from website
Web: ewh.ieee.org/mu/scv-sscs

In this tutorial, the iterative decoding techniques for non-binary LDPC codes will be presented, both from the theoretical aspects of Belief Propagation and its analysis, and from more practical aspects of efficient implementation.? In a first (more…)

Webinar: Standards-Driven Application Development for the Energy and Utilities Industry

by @ 7:08 pm. Filed under ALL, Communications, Electrical/Power
 

THURSDAY August 19, 2010
SPECTRUM Magazine
Speaker: Irv Badr, Energy & Utilities, IBM Rational
Time: Presentation at 1:00 AM (1 hour)
Cost: none
Place: On the Internet
RSVP: from the website
Web: spectrum.ieee.org/webinar/1642472

Mtg: HCPV Tracker Accelerated Reliability Tests

by @ 6:52 pm. Filed under ALL, Electrical/Power, Electronics Design, Engineering Mgmt
 

WEDNESDAY October 27, 2010
SCV Reliability Chapter
Speaker: Jon G. Elerath, Staff Reliability Engineer, SolFocus
Time: Social/refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Hewlett Packard Oak Room, Bldg 48, 1911 Pruneridge Ave, Cupertino
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/rl

An accelerated reliability test plan was developed for trackers used in high-concentration photo-voltaic power systems.? The potential failure modes of the tracker hardware were used to select the hardware that was tested.? The 2-parameter (more…)

Mtg: Development and Application of Accelerated Test Methods Specific to CPV Systems

by @ 6:42 pm. Filed under ALL, Electrical/Power, Electronics Design, Engineering Mgmt, Optics/Displays, Semiconductors
 

WEDNESDAY September 29, 2010
SCV Reliability Chapter
Speaker: Mark Spencer, Staff Reliability Engineer, SolFocus
Time: Social/refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Hewlett Packard Oak Room, Bldg 48, 1911 Pruneridge Ave, Cupertino
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/rl

SolFocus is currently involved in two separate accelerated test efforts to quantify the long term life of its SF1100 CPV (concentrator photovoltaic) product.? Results from these tests will be correlated with the ongoing monitoring of (more…)

Mtg: SolFocus Concentrator Photovoltaics â?? An Introduction

by @ 4:12 pm. Filed under ALL, Electrical/Power, NanoEngineering, Optics/Displays, Semiconductors
 

TUESDAY September 21, 2010
SCV Nanotechnology Chapter
Speaker: Dr. Phil Metz, Director of Business Development, SolFocus
Time: Registration & light lunch 11:30 AM; Presentation at 12:00 Noon
Cost: IEEE Members and Students $5; Non-Members $10
Place: National Semiconductor Bldg E-1 CMA Room. 2900 Semiconductor Drive, Santa Clara
RSVP: from the website
Web: www.ieee.org/nano

This presentation introduces the SolFocus Concentrator Photovoltaic (CPV) product â?? what it is and how it works.? It presents the value proposition for SolFocus CPV and the design and manufacturing advantages of this product vs. other (more…)

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