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September 10, 2010

Mtg: Principles of Canesta CMOS 3D Time of Flight Systems

by @ 11:50 am. Filed under ALL, Communications, Electronics Design, Optics/Displays, Semiconductors
 

MONDAY September 13, 2010
SCV Signal Processing Chapter
Speaker: Cyrus Bamji, Co-founder and CTO, Canesta
Time: Networking and pizza at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: National Semiconductor, Building E, Conference Room, 2900 Semiconductor Dr, Santa Clara
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/sps

Canesta’s 3D electronic perception technology allows electronic devices to perceive their environment by providing accurate 3D information about the world around them.? Canesta’s 3D time of flight sensor is a massively parallel LIDAR on a single CMOS chip. When coupled to a light source such as a LED, laser or VCSEL, each 3D pixel on the chip provides independent distance information to objects in the field of view of the device. The basic operating principle of Canesta’s CMOS phase-based pixel technology is described. ? An analysis of the factors influencing sensor performance is presented and an explanation of how to build a time of flight system that meets the requirements of a given application is provided. Applications for 3D time of flight systems are described and advantages of these systems over competing methods are discussed. Canesta’s latest high resolution 3D camera will be demonstrated.

Webinar: High Fidelity Physical Models of Automotive Batteries

by @ 5:08 am. Filed under Computers/Software, Electrical/Power, Engineering Mgmt, NanoEngineering
 

WEDNESDAY September 22, 2010
SPECTRUM Magazine
Speakers: Dr. Tom Lee, Vice President, Maplesoft; Dr. John McPhee, Chair for Mathematics-based Modeling, University of Waterloo; Dr. Thanh-Son Dao, Dept. of Systems Design Engineering, University of Waterloo
Time: 1-hour Presentation at 11:00 AM PDT
Cost: none
Place: On the Web
RSVP: on the website
Web: spectrum.ieee.org/webinar/1679787

The auto industry is in transformation. New generation vehicles deploying hybrid (HEV), fully electric (EV), and fuel cell powerplants are presenting significant challenges to automotive engineers. The complexity (more…)

Mtg: Object Bank: An Object-Level Image Representation for High-Level Visual Tasks

by @ 4:59 am. Filed under ALL, Computers/Software, Electronics Design, Engineering Mgmt, Optics/Displays
 

THURSDAY September 23, 2010
SCV Robotics and Automation Chapter
Speaker: Jia Li, Stanfor University
Time: Presentation at 7:00 PM
Cost: none
Place: Carnegie Mellon University – SV, NASA Research Park, Bldg. 23, Moffett Field
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/ras

Robust low-level image features have been proven to be effective representations for a variety of tasks such as object recognition and scene classification; but pixels, or even local image patches, carry little (more…)

Mtg: SOFIA: NASA’s Stratospheric Observatory for Infrared Astronomy

by @ 4:35 am. Filed under ALL, Communications, Computers/Software, Electronics Design, Optics/Displays
 

TUESDAY November 2, 2010
SCV Photonics Chapter
Speaker: Dr. Dana Backman, SETI Institute
Time: Networking/Light Dinner at 6:00 PM; Presentation at 7:00 PM
Cost: none
Place: National Semiconductor Building E Auditorium, 2900 Semiconductor Drive, Santa Clara
RSVP: From the website
Web: ewh.ieee.org/r6/scv/leos

SOFIA, a 2.5-meter (100-inch) telescope mounted in a 747SP aircraft, is nearing the end of its development and testing phase and is ready to start regular scientific observations by the end of 2010. You’ll (more…)

Mtg: Selective Coordination Issues with 30-Cycle Transfer Switches

by @ 4:15 am. Filed under ALL, Electrical/Power, Engineering Mgmt
 

TUESDAY October 26, 2010
SF Industry Applications Chapter
Speaker: Jim Hoyt, Harold Wells Associates, Inc.
Time: Networking at 5:30 PM; Presentation at 6:00 PM; Dinner at 7:00 PM
Cost: $30
Place: Sinbadâ??s Restaurant, Pier 2 The Embarcadero, San Francisco
RSVP: by email to Frank Sylvester, fsylvester@sfwater.org
Web: www.e-grid.net/docs/1010-sf-ias.pdf

Selective coordination, first required by the NEC in 1993, is a complicated process of coordinating the ratings and settings of overcurrent protective devices, such as circuit breakers, fuses, and (more…)

Webinar: Hall Effect Measurements for Semiconductors

by @ 3:57 am. Filed under ALL, Electrical/Power, Electronics Design, Engineering Mgmt, NanoEngineering, Semiconductors
 

THURSDAY September 23, 2010
SPECTRUM Magazine
Speaker: Robert Green, Senior Market Development Manager, Keithley Instruments
Time: 1-hour Presentation at 11:00 AM PDT
Cost: none
Place: WEb
RSVP: on the website
Web: spectrum.ieee.org/webinar/1668651

This seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. The search for new semiconductor materials, more (more…)

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