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April 5, 2012

Mtg: Whisker Formation Induced by Component and Assembly Ionic Contamination

by @ 7:43 am. Filed under ALL, Electronics Design, Engineering Mgmt
 

THURSDAY April 5, 2012
SCV Reliability Chapter
Speaker: Dr. Polina Snugovsky, Chief Metallurgist, Celestica
Time: Networking/snacks at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Oak Room, Hewlett Packard, Wolfe Avenue, Cupertino
RSVP: not required
Web: ewh.ieee.org/r6/scv/rl

The talk will describe the results of an intensive whisker formation study on Pb free assemblies with different level of cleanliness.? Thirteen types of as-received surface mount (SMT) and pin-through-hole (PTH) components were (more…)

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