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September 21, 2012

Workshop: IEEE-SCV Soft Error Rate (SER)

by @ 1:15 pm. Filed under ALL, Computers/Software, Electronics Design, Engineering Mgmt, NanoEngineering, Semiconductors
 

THURSDAY October 25, 2012
SCV Components, Packaging and Manufacturing Technology, with Electron Devices and Reliability
Subject: 4th
Speakers: Nelson Tam, Marvell; Robin Gardiner, Matheson Gas; Bharat Bhuva, Vanderbilt University; Jeff Wilkinson, Medtronic; Brendan McNally, XIA; Mike Gordon, IBM; Shah Jahinuzzaman, Intel; Brett Clark, Honeywell; Yi-Pin Fang, TSMC; Sang H. Baeg, Hanyang University
Time: Registration, equipment demo and light lunch at 11:00 AM; Presentations from 11:30 AM – 5:00 PM
Cost: none
Place: Live on the internet, or at Cisco Systems, Building 15, 3750 Cisco Way, San Jose
RSVP: from website
Web: www.cpmt.org/scv/meetings/cpmt1210w.html

The 4th annual IEEE Santa Clara Valley SER Workshop provides a unique forum for component manufacturers, assembly houses, and electronic system manufacturers to exchange innovative ideas and recent results on the measurement, (more…)

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