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Technology & Networking in Silicon Valley & the SF Bay Area: Upcoming Meetings, Courses and Conferences

February 25, 2013

Int’l Reliability Innovations Conference

by @ 3:47 pm. Filed under ALL, Communications, Computers/Software, Electronics Design, Engineering Mgmt, Semiconductors
 

THURSDAY March 7, 2013
SCV Reliability, with Components, Packaging and Manufacturing Technology Chapter
Speakers: from Google, BAE Systems, Juniper, Western Digital, IROC Technologies, UCONN, Ilan University
Time: Light breakfast/registration at 8:00 AM; ends at 4:30 PM
Cost: None (includes breakfast and lunch)
Place: Cisco Systems, 560 MaCarthy Blvd, San Jose (and also live, over the Internet)
RSVP: from website
Web: www.reliabilityinnovations.org

IRIC creates an environment where engineering professionals share their innovations for today’s and tomorrow’s challenges in the area of reliability that resulted in a robust product. It takes the current state (more…)

Laser Tag and Social Hour

by @ 12:51 pm. Filed under ALL, Communications, Computers/Software, Electrical/Power, Electronics Design
 

MONDAY April 29, 2013
SCV Grads of the Last Decade (GOLD)
Time: Suit up at 6:00 PM; Tag from 6:30 – 8:30 PM; then drinks at Sports Bar nex tdoor
Cost: $23 IEEE Members, $26 Non-IEEE Members (includes 3 games)
Place: Laser Quest, 1400 N. Shoreline Blvd., Mountain View
RSVP: from website; limit of 40 tickets
Web: www.ieee-scv-gold.org

Join IEEE SCV GOLD for a friendly game of Laser tag.? Come out to network with your fellow Bay Area engineers!? After the game (around 8:30PM), join us at Sports Page for a cool one.

Webinar: Additive Manufacturing 101: Changing the Future of Product Development and Manufacturing

by @ 11:03 am. Filed under ALL, Electronics Design, NanoEngineering, Semiconductors
 

THURSDAY February 28, 2013
SPECTRUM Magazine
Speaker: Jonathan L. Cobb, Executive Vice President, Marketing, Stratasys Ltd.
Time: Presentation at 11:00 AM (PST)
Cost: none
Place: on the Internet
RSVP: From website
Web: spectrum.ieee.org/webinar/2213796

Mtg: The Value of Ultra-Efficient Transformers as an Effective Energy Measure: Moving Beyond Energy Policy Act 2005

by @ 11:02 am. Filed under ALL, Electrical/Power
 

WEDNESDAY February 27, 2013
SF Power & Energy Chapter
Speaker: Peter Ouellette, Powersmiths International
Time: Light lunch at 11:30 AM; Presentation at Noon
Cost: no charge for IEEE members, $5 for non-members
Place: Pacific Gas & Electric Conference Room #305, 77 Beale Street, San Francisco
RSVP: by Feb. 25 to Charles Mee, charles.mee@cpuc.ca.gov, 415-703-1147
Web: www.e-grid.net/docs/1302-sf-pes.pdf

In 2005 the Department of Energy announced upcoming legislation: รข??Energy Policy Act 2005???, where for the first time a minimum efficiency for transformers was implemented.? As of January 1, (more…)

Mtg: Role of NFC in the Future of Digital Wallet

by @ 11:01 am. Filed under ALL, Communications, Electronics Design
 

TUESDAY February 26, 2013
SCV Consumer Electronics Chapter
Speaker: Sunil Jain, Intel
Time: Networking, pizza at 6:30 PM; Presentation at 7:00 PM
Cost: $5 for IEEE members, $10 for non-members
Place: Microsoft Silicon Valley, 1065 La Avenida, Mountain View
RSVP: from website
Web: ewh.ieee.org/r6/scv/ce

Near Field Communication (NFC) is rapidly becoming an exciting opportunity in mobile devices. In this session, we will discuss the new experiences NFC promotes and the challenges this technology presents. Topics (more…)

Mtg: Remote Diagnostics and Failure Prevention of Emergency Generator Systems

by @ 11:00 am. Filed under ALL, Electrical/Power
 

TUESDAY February 26, 2013
SF Industry Applications Chapter
Speaker: David Carpenter, Director of Sales, Omnimetrix, LLC
Time: Networking at 5:30 PM; Presentation at 6:00 PM; Dinner at 7:00 PM
Cost: $25 ($10 for IEEE Student members)
Place: Sinbad’s Restaurant, Pier 2 The Embarcadero, San Francisco
RSVP: by email to Brandon Yee, byee@yeiengineers.com
Web: www.e-grid.net/docs/1302-sf-ias.pdf

Most generator system failures are caused by consumables, such as battery, fuel, oil, and water.? Monitoring the status of these and other key performance parameters can provide critical information to both (more…)

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