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March 16, 2013

Int’l Reliability Physics Symposium (IRPS)

by @ 3:23 pm. Filed under ALL, Electronics Design, Engineering Mgmt, NanoEngineering, Semiconductors
 

IEEE Electron Devices, Reliability Societies
IEEE Int’l Reliability Physics Symposium (IRPS)
— April 14-18, 2013  — Hyatt Regency Monterey
— Keynote, 28 Tutorials, Exhibits  — Over 180 papers
The premiere conference for engineers and scientists in the area of microelectronics reliability, with participants from US, Europe, Asia. Reliability of semiconductor devices, ICs, and microelectronic assemblies through physics of failure, the application environment. ? Two-day tutorial program plus evening workshops. ? ? Special focus areas: compact nodeling, circuit reliability, high-k dielectrics, interconnects, 3D/TSV, chip/packaging interactions. . ? Vendor exhibits and equipment demonstrations.
Register before March 30, for best rates. For more information: www.irps.org

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