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October 12, 2013

Mtg: Creating a Measurement Monitoring System for Making Fast Quality Decisions

by @ 8:24 am. Filed under ALL, Electronics Design, Engineering Mgmt, Semiconductors
 

WEDNESDAY October 23, 2013
SCV Instrumentation and Measurement Chapter
Speaker: John Wilson, Agilent Technoligies
Time: Presentation at 6:00 PM
Cost: none
Place: SJSU, Industrial Studies Building, Room 116, One Washington Square, San Jose
RSVP: from website
Web: meetings.vtools.ieee.org/meeting_view/list_meeting/21169

Agilentâ??s Calibration Measurement Monitoring System (CMMS) is an internal tool used to monitor the calibration processes used by Agilentâ??s service centers. CMMS, while making use of statistical process control, is more than just statistical process (more…)

131023scv

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