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Technology & Networking in Silicon Valley & the SF Bay Area: Upcoming Meetings, Courses and Conferences

October 23, 2013

Mtg: State of the Gaming Industry – Technology & Trends

by @ 10:08 am. Filed under ALL, Communications, Computers/Software, Electronics Design, Semiconductors
 

TUESDAY December 3, 2013
SCV Consumer Electronics Chapter
Speaker: Dean Takasahashi, lead writer, GamesBeat
Time: Networking at 6:30 PM; Presentation at 7:00 PM
Cost: $5 for members, $10 for non-members
Place: National Instruments, 4600 Patrick Henry Dr, Santa Clara
RSVP: from website
Web: ewh.ieee.org/r6/scv/ce

With the recent $1B three day sales results for GTA5, new consoles for the holiday season and the opening of China to consoles, the gaming marketplace is extremely active.  In addition to these high profile activities, new (more…)

131203scv

Mtg: Optical and Electronic Approaches to Restoration of Sight to the Blind

by @ 9:50 am. Filed under ALL, BioEngineering, Electronics Design, Optics/Displays
 

TUESDAY November 5, 2013
SCV Photonics Chapter
Speaker: Prof. Daniel Palanker, Stanford University
Time: Networking and Pizza at 6:00 PM; Presentation 7:00 PM
Cost: none
Place: Intel, Building SC-12, 3600 Juliette Lane, Santa Clara
RSVP: from website
Web: ewh.ieee.org/r6/scv/leos

Retinal degenerative diseases lead to blindness due to loss of the “image capturing” photoreceptors, while neurons in the “image-processing” inner retinal layers are relatively well preserved.  Information can be reintroduced into (more…)

131105scv

Mtg: Thermoreflectance Technique for Thermal Characterization and Thermal Mapping

by @ 9:22 am. Filed under ALL, Electronics Design, Optics/Displays, Semiconductors
 

THURSDAY November 7, 2013
SCV Reliability Chapter
Speakers: Dr. Mo Shakouri, Dustin Kendig, Mark Aghili, Microsanj LLC
Time: Sign-in/Networking at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Agilent Technologies, 5301 Stevens Creek Blvd, Santa Clara
RSVP: not required
Web: ewh.ieee.org/r6/scv/rl

Transient thermal analysis is becoming a critical tool in research, development and quality analysis of state of art devices and circuits.  This educational workshop will cover an overview of thermal imaging techniques, the latest on (more…)

131107scv

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