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November 13, 2014

Mtg: Quality of PV Modules Around the World: Qualification Testing Failure Rate Results from China, Germany, India, Japan, Korea and US

by @ 1:51 pm. Filed under ALL, Electrical/Power, Electronics Design, Optics/Displays, Semiconductors
 

Wednesday December 10, 2014
SCV Photovoltaics Chapter
– unqualified materials, warranty rate, recall history, design evolution …
Speakers: Matthias Heinze, Director Business Development, Global Business Field at TUV Rheinland
Time: Networking and refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Palo Alto Research Center (G.E. Pake Auditorium), 3333 Coyote Hill Road, Palo Alto
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/pv

Qualification testing of photovoltaic modules, according to IEC 61215 or IEC 61646 standard, is generally considered as a minimum requirement for reliability. Between 2011 and 2013, there was immense price pressure on PV module (more…)

20141210scv

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