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March 14, 2015

Surface and Materials Engineering for Enhanced MEMS Reliability

by @ 8:51 pm. Filed under ALL, Blogroll, Semiconductors
 

Thursday, April 2nd, 2015
SCV Reliability Chapter, co-sponsored by IEEE SFBA MEMS & Sensors Chapter
Subject: Surface and Materials Engineering for Enhanced MEMS Reliability
– adhesion (also called stiction), friction, wear and corrosion, silicon carbide (SiC), a wide bandgap semiconductor…
Speaker: Prof. Roya Maboudian of University of California, Berkeley
Time: 6 pm to 8 pm
Cost: Free
Place: Atmel, 1600 Technology Drive, San Jose
RSVP: https://meetings.vtools.ieee.org/m/33519

20150402ALL

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