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April 20, 2015

An introduction to the 3D Subnanometer Compositionally Sensitive Technique of Atom Probe Tomography

by @ 5:09 pm. Filed under ALL, NanoEngineering
 

Tuesday, June 16, 2015 
Nanotechnology Council 
Subject: An introduction to the 3D Subnanometer Compositionally Sensitive Technique of Atom Probe Tomography 
– Local Electrode Atom Probe (LEAP), semiconductor applications, advantages for yield and data quality… 
Speaker: Mr. Robert Ulfig, LEAP Product Manager, Cameca SAS 
Time: Networking, Pizza & drinks and talk, 12:00 noon to 1 pm 
Cost: Free 
Place: Texas Instruments Building E Conference Center, 2900 Semiconductor Dr., Santa Clara 
RSVP: http://sites.ieee.org/sfbanano/

20150616NANO

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