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June 4, 2015

A New Drop Test for BGA Assemblies: Duplicable and Effective

by @ 4:21 pm. Filed under ALL, Electronics Design, Semiconductors
 

Tuesday, July 7, 2015 
SCV Components, Packaging, and Manufacturing Technologies (CPMT) 
Subject: A New Drop Test for BGA Assemblies: Duplicable and Effective 
– new test vehicle (TV), energy dissipation or delta V during the drop cycle play a key role but has been neglected by current JEDEC drop test standard …
Speaker: Dongji Xie, Senior Manager, System Reliability, NVIDIA 
Time: 5:45 pm, check-in, light food, networking; 6:30 pm: presentation 
Cost: $5 non-IEEE members, Free for members (please use code IEEE2015); Talk-Only: FREE, please check-in by 6:15 pm 
Location: Texas Instruments (TI), Building E Conference Center, 2900 Semiconductor Dr., Santa Clara 
Event Details: http://www.cpmt.org/scv/meetings/cpmt1507.html 
RSVP: https://www.eventbrite.com/e/duplicable-and-effective-a-new-drop-test-for-bga-assemblies-registration-17269391214

20150707ALL

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