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July 17, 2015

Macroscopic & Stochastic Aspects of Negative Bias Temperature Instability

by @ 12:42 pm. Filed under ALL, Electronics Design, Semiconductors, Signal Processing
 

Thursday, August 6, 2015 
SCV Reliability Society and SCV Electron Devices Society 
Subject: Macroscopic & Stochastic Aspects of Negative Bias Temperature Instability 
– shift in MOSFET parameters, defect generation explained from both macroscopic and stochastic viewpoints … 
Speaker: Souvik Mahapatra, Professor of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India 
Time: 6:00 to 6:30 pm: Check-in and refreshments 6:30 to 7:30: Presentation 
Cost: Free 
Location: Qualcomm, 3165 Kifer Rd, Santa Clara, in the cafeteria 
Event Details: http://ieee-scv-rel-aug-2015.eventbrite.com

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