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September 16, 2015

Engineering the right accelerated life tests for reliability qualification (customer use conditions vs. industry standards based approaches)

by @ 1:48 pm. Filed under ALL, Electronics Design
 

Thursday, October 1, 2015 
SCV Reliability Society 
Subject: Engineering the right accelerated life tests for reliability qualification (customer use conditions vs. industry standards based approaches) 
– customersâ?? usage behaviors and physics of failure expose, comparisons between standards and use conditions… 
Speaker: Sudarshan Rangaraj, Ph.D, Amazon Lab126 Reliability Manager 
Time: 6:00 to 6:30 pm: check in and food: 6:30pm to 7:30pm: Presentation and Q&A 
Cost: Free; Food sponsored by ICE Labs, ISO 9001 & 17025 Reliability Test Lab. www.icenginc.com 
Location: Qualcomm, 3165 Kifer Road, Santa Clara 
Chapter website: http://ewh.ieee.org/r6/scv/rl/ 
RSVP required: https://www.eventbrite.com/e/engineering-the-right-accelerated-life-tests-for-reliability-qualification-tickets-18549595339

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