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Technology & Networking in Silicon Valley & the SF Bay Area: Upcoming Meetings, Courses and Conferences

August 30, 2016

Reliability and Performance of Carbon Nanotube Vias

by @ 10:38 pm. Filed under ALL, Reliability, Semiconductors
 

Thursday, December 1, 2016
SCV Reliability Chapter
Subject: Reliability and Performance of Carbon Nanotube Vias
– IC technology node continues to scale down to the sub-10 nm regime, new materials with higher current-carrying capacities than Cu and W such as carbon nanotubes (CNTs) and graphene are needed …
Speaker: Dr. Cary Y. Yang, Professor of Electrical Engineering and Director of TENT Laboratory, a SCU facility located inside NASA Ames
Time: 6:00 to 6:30 pm: Sign in, snacks and social; 6:30 to 7:30 pm: Presentation; 7:30 to 8:00 pm: Question and Answer Session
Cost: Free
Location: Qualcomm, Inc., 3165 Kifer Road, Santa Clara, in the cafeteria
Event Details: http://ewh.ieee.org/r6/scv/rl/
Please register so as to know how much food to purchase: https://www.eventbrite.com/e/cnt-reliability-tickets-27427113234
Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.com

20161201ALL

CPI Stress Induced Carrier Mobility Shift in Advanced Silicon Nodes

by @ 10:26 pm. Filed under ALL, Electronics Design, Reliability, Semiconductors
 

Thursday, November 3, 2016
SCV Reliability Chapter, Electron Device Society (EDS), and Components, Packaging, and Manufacturing Technologies (CPMT) 
Subject: CPI Stress Induced Carrier Mobility Shift in Advanced Silicon Nodes
– mechanical stress and the consequent effects on device performance for advanced three-dimensional (3-D) IC technologies …
Speaker: Valeriy Sukharev, Technical Lead, Design to Silicon Division (Calibre) of Mentor Graphics Corporation
Time: 6:00 to 6:30 pm: Sign in, snacks and social; 6:30 to 7:30 pm: Presentation; 7:30 to 8:00 pm: Question and Answer Session
Cost: Free
Location: Qualcomm, Inc., 3165 Kifer Road, Santa Clara, in the cafeteria
Event Details: http://ewh.ieee.org/r6/scv/rl/
Please register so as to know how much food to purchase: https://www.eventbrite.com/e/cpi-stress-induced-carrier-mobility-shift-in-advanced-silicon-nodes-tickets-27427049042
Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.com

20161103ALL

Reliability and The Self-Driving Car

by @ 10:15 pm. Filed under ALL, Electronics Design, Reliability
 

Thursday, October 6, 2016
SCV Reliability Chapter
Subject: Reliability and The Self-Driving Car
– 94% of traffic accidents involve human error, developing a self-driving vehicle from the ground up, and employing the best design for reliability and reliability test practices…
Speaker: Noah Lassar, Senior Manager of Reliability for the Google[X] Self-Driving Car
Time: 6:00 to 6:30 pm: Sign in, snacks and social; 6:30 to 7:30 pm: Presentation; 7:30 to 8:00 pm: Question and Answer Session
Cost: Free
Location: Qualcomm, Inc., 3165 Kifer Road, Santa Clara, in the cafeteria
Event Details: http://ewh.ieee.org/r6/scv/rl/
Please register so as to know how much food to purchase: https://www.eventbrite.com/e/reliability-and-the-self-driving-car-tickets-27426937709
Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.com

20161006ALL

Vehicle Safety Communication: The Promise, Recent Trends, and a Prognosis

by @ 3:54 pm. Filed under ALL, Computers/Software, Control Systems, Vehicular Technology
 

Wednesday, September 7, 2016
SCV Vehicular Technology Society (VTS)
Subject: Vehicle Safety Communication: The Promise, Recent Trends, and a Prognosis
– cellular connectivity, connected vehicle futures, given that there are different use cases, different regulatory and spectrum requirements in different world regions…
Speaker: Jim Misener, Director, Technical Standards, Qualcomm
Time: 11:30 am: Light lunch & networking; 12 pm to 12:45 pm: Presentation; 12:45 pm to 1 pm: Q/A
Cost: Free, but a $5 donation to cover the cost of the food and drink is requested
RSVP: dhavaljb@ieee.org by 9/04/16 to help us order enough food & soft drinks
Location: Texas Instruments, Building E Conference Center, 2900 Semiconductor Drive, Santa Clara
Event Details: http://sites.ieee.org/scv-vts/event/vehicle-safety-communication-the-promise-recent-trends-and-a-prognosis/

20160907ALL

MIPI DevCon 2016 – September 14-15 at the Computer History Museum

by @ 3:20 pm. Filed under ALL, Computers/Software
 

Register Now for MIPI DevCon 2016 – September 14-15 at the Computer History Museum

DevConProviding developers and implementers of MIPI Specifications a forum for
* Training
* Education
* Networking
* Implementation experiences, use cases, and application examples from a technical perspective.
See our speaker list here.

MIPI DevCon 2016 – Moving Mobile Forward. http://www.mipi.org/devcon

 

20160914ALL

SFBA MEMS and Sensors Chapter

by @ 3:05 pm. Filed under ALL, Semiconductors
 

Thursday, October 13, 2016
SFBA MEMS and Sensors Chapter
Subject: IEEE Workshop on Flexible/Printed/Fabric Sensors and Systems
– one-day workshop, topics of printed/flexible/fabric sensors and accompanying electronics and the applications, interactive panel discussion…
Time: 9:00 pm to 5:00 pm, includes continental breakfast, lunch, and evening mixer

Cost: General $65, IEEE Member: $45, Student: $25
Location: Northeastern University – Silicon Valley Campus, 6024 Silver Creek Valley Rd, San Jose
Event Details: http://sites.ieee.org/scv-mems/files/2013/09/IEEE-Workshop-Call-for-Abstracts.pdf

20161013ALL

Metrology in Nanotechnology

by @ 2:42 pm. Filed under ALL, NanoEngineering
 

Tuesday, October 18, 2016
SFBA Nanotechnology Chapter
Subject: Metrology in Nanotechnology
– A review of new metrology tools and their applications in nanotechnology …
Speaker: Dr. Min Yang, Director of Applications Development, Bruker Nano Surfaces
Time: 11:30 am: Networking, pizza & drinks; 12:00 noon to 1 pm: Seminar
Location: Texas Instruments, Building E Conference Center, 2900 Semiconductor Dr., Santa Clara
Event Details: https://www.eventbrite.com/e/metrology-in-nanotechnology-tickets-27364078696

 

Chapter website: http://sites.ieee.org/sfbanano/



20161018ALL

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