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October 25, 2016

 An Introduction to Free-Field Measurements of Wireless Devices in Reverberation Chambers 

by @ 3:05 pm. Filed under ALL, Magnetics
 

Tuesday, November 8th 2016 
SCV Electromagnetic Compatibility Chapter (EMC)
Subject: An Introduction to Free-Field Measurements of Wireless Devices in Reverberation Chambers 
– recent research and some of the issues related to the use of these chambers for testing devices that transmit modulated signals. …
Speaker: Kate Remley, NIST
Time: 5:30: Networking/light dinner; 6:30 pm: Presentation; 7:45 pm: Adjourn
Cost: Water and soft drinks are free. Food is available for a small fee. 
Location: 7layers, 1293 Anvilwood Ave. Sunnyvale 
Event Details: http://www.ewh.ieee.org/r6/scv/emc/ 

20161108ALL

Advances in Plasma Nano-Coating

by @ 2:03 pm. Filed under ALL, Semiconductors
 

Tuesday, November 8, 2016
SCV Components, Packaging, and Manufacturing Technologies (CPMT)

Subject: Advances in Plasma Nano-Coating
– inherently superior properties, coatings tend to be highly dense and pinhole-free, enhancing the reliability of the devices used in consumer electronics …
Speaker: Dr. Abe Ghanbari, Chief Solutions Officer, Semblant
Time: 11:30 pm: Registration, networking, and refreshments; 12:00 pm to 1:00 pm: Presentation
Cost with advanced registration: IEEE Members, students, unemployed: $5; IEEE Non-Members: $10. At the door prices: add $5 to each category.
Location: Texas Instruments, Building E Conference Center, 2900 Semiconductor Dr., Santa Clara
Event Details: http://www.cpmt.org/scv/

20161108ALL

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