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January 26, 2017

Copper Pillar, ELK, and Solder: The Challenges of Assembly and Long-Term Reliability at 28nm and 16nm 

by @ 1:19 pm. Filed under ALL, Reliability, Semiconductors
 

Thursday, February 9th, 2017 
SCV Reliability Society and Components, Packaging, and Manufacturing Technologies (CPMT) 
Subject: Copper Pillar, ELK, and Solder: The Challenges of Assembly and Long-Term Reliability at 28nm and 16nm 
– increasing use of ELK and ULK, especially at higher metal layers, has allowed for lower RC constants and better performance, come at a cost… 
Speakers: Dr. Craig Hillman of DfR Solutions, CEO 
Time: 6:00 pm: Check in, networking, refreshments 6:30 pm: Presentation; 7:30 pm: Adjourn 
Cost: Free; Food sponsored by: ICE Labs, ISO 9001 & 17025 Reliability Test Lab. www.icenginc.com 
Location: Qualcomm, Inc. (Building-B Cafeteria), 3165 Kifer Road, Santa Clara
Event Details: https://scvrelfeb2017.eventbrite.com/ 

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