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February 12, 2017

Set-Top Box – Architectural Trend Towards Smaller, Faster, Cheaper

by @ 11:49 pm. Filed under ALL, Consumer Electronics
 

Tuesday, February 28th, 2017 
SCV Consumer Electronics Society (CE Society) 
Subject: Set-Top Box – Architectural Trend Towards Smaller, Faster, Cheaper
– A conversation about the market dynamics and system architectural trends towards a smaller, faster, and cheaper STB solution.  A comparison of different STB types and key features that drives STB design trends … Speaker: Hoan Tran – Micron Global Sr. Segment Manager, Connected Home 
Time: 6:30 pm: Registration, networking, a pizza, & drinks; 7:00 pm to 9:00 pm: Presentation 
Cost: IEEE CES members: free: IEEE Student members: free; IEEE members: $5 (pay at door): Non-members: $10 (pay at door) 
Location: NVIDIA, 2800 Scott Blvd., Building E, Santa Clara 
Event Details: http://sites.ieee.org/scv-ces/event/set-top-box-architectural-trend-towards-smaller-faster-fheaper/ 
Registration: https://www.eventbrite.com/e/ieee-consumer-electronics-society-feb-meeting-tickets-24275589943

20170228ALL

Data Analytics-Propelled Reliability Engineering 

by @ 11:13 pm. Filed under ALL, Reliability
 

Thursday, March 2nd, 2017 
SCV Reliability Society and Components, Packaging, and Manufacturing Technologies (CPMT) 
Subject: Data Analytics-Propelled Reliability Engineering 
-Parametric measurements and Machine Learning provide tools to propel reliability decision making to the next level in all phases of the product life cycle … 
Speakers: Bernhard Hiller, Leader of the Advanced Reliability Engineering team, Western Digital Corporation 
Time: 6:00 pm: Check in, networking, refreshments 6:30 pm: Presentation; 7:30 pm: Adjourn 
Cost: Free; Food sponsored by: ICE Labs, ISO 9001 & 17025 Reliability Test Lab www.icenginc.com 
Location:  Google, 2011 Stierlin Ct., Mountain View
Event Details: https://www.eventbrite.com/e/data-analytics-propelled-reliability-engineering-tickets-32342714931 

20170302ALL

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