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April 21, 2017

The relationship between Reliability Testing and Failure Analysis 

by @ 5:25 pm. Filed under ALL, Reliability
 

Thursday, May 4, 2017 
SCV Reliability Society 
Subject: The relationship between Reliability Testing and Failure Analysis 
– variety of standard reliability test methods and the issues they stress, typical failures found and the methods used to find them … 
Speaker: Daniel Sullivan, EAG Lab
Time: 6:00 pm: Registration, networking, and refreshments; 7:30 pm to 8:00 pm: Presentation
Cost: Free
Location: Qualcomm, Inc., 3165 Kifer Road, Building-B Cafeteria, Santa Clara 
Event Details: https://www.eventbrite.com/e/the-relationship-between-reliability-testing-and-failure-analysis-tickets-33883619819?aff=eivtefrnd?utm_source=eb_email&utm_medium=email&utm_campaign=evitefrnd&utm_term=eventimage 

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