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July 26, 2017

A Realistic and Useful ESD Test for Consumer Electronics

by @ 11:09 am. Filed under ALL, Reliability
 

Thursday, August 3, 2017 
SCV Reliability Society 
Subject: A Realistic and Useful ESD Test for Consumer Electronics
– new ESD test is being proposed for consumer electronics that is representative of field conditions and allows the prediction of field reliability…
Speaker: Michael Heaney, Principal Physicist, Amazon Lab126
Time: 6:00 pm: Registration, networking, and refreshments; 6:30 pm – 8:00 pm: Presentation and Q&A  
Cost: Free
Location: Qualcomm, Inc. (Building-B Cafeteria), 3165 Kifer Road, Santa Clara
Food sponsored by: ICE Labs, ISO 9001 & 17025 Reliability Test Lab. www.icenginc.com 
Eventbrite: https://www.eventbrite.com/e/a-realistic-and-useful-esd-test-for-consumer-electronics-tickets-36530947046

201710803ALL

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