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October 31, 2007

Int’l Symposium for Testing and Failure Analysis

by @ 8:39 am. Filed under ALL, Communications, Computers/Software, Electronics Design, Optics/Displays, Semiconductors
 

33rd Int’l Symposium for Testing and Failure Analysis
– November 4-8, 2007 ? – San Jose Convention Center
ISTFA’07 combines technical sessions, tutorials, an exhibition, and user group meetings with a focus on making the full experience a strong benefit for the attendee.

  • 16 Technical Sessions & Panel Discussions
  • 4 Technology-Specific User Groups
  • 5 One-Day Pre- & Post-conference Short Courses
    Educational Tutorials:? – Materials Characterization for Failure Analysis ? – Failure Localization with Active and Passive Voltage Contrast in FIB and SEM ? – Failure Analysis Flow Decision Tree ? – The Role of the AFM in Yield and Failure Analysis ? – Reliability in MEMS Packaging ? – Analog Building Blocks: Circuits and Devices ? – Diagnosing Analog Circuits ? – Yield Basics for Failure Analysis including 300mm Water and Cu Technology (and more!) More information: www.ISTFA.org
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