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March 12, 2010

Mtg: Demystifying RF Fields; Capturing Key Performance Data on RF Power Amplifiers

by @ 8:12 am. Filed under ALL, Communications, Electronics Design
 

TUESDAY April 13, 2010
SCV Electromagnetic Compatibility Chapter
Speaker: Tom Mullineaux, MILMEGA Limited
Time: Networking and light dinner at 5:30 PM; Presentation at 6:30 PM
Cost: fee for dinner; free drinks/snacks
Place: Applied Materials Bowers Cafeteria, 3090 Bowers Ave., Santa Clara
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/emc

This presentation looks at the situation that great 18th and 19th century masters faced along the uncharted road from static electricity to the prediction and discovery of RF fields.? The story picks up with Benjamin Franklin’s contribution to static electricity and then describes the ‘great race’ that followed the accidental discovery that an electric current deflects a compass needle.? The talk is rounded off with an explanation of the working of common RF components.
RF immunity standards do not require periodic calibration of the RF amplifiers used in RF immunity testing.? This is justified from a strictly technical point of view, yet creates the situation where there is no data on file for the most expensive piece of equipment in the test set-up.? This presentation goes through the key amplifier performance metrics, and introduces a simple/swift method of capturing key data that can be held on file as ‘trend-analysis’ data.

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