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November 28, 2007

Mtg: Radiated and Conducted Emission Debug Techniques

by @ 7:34 am. Filed under ALL, Communications, Computers/Software, Electronics Design, Engineering Mgmt, Semiconductors

TUESDAY December 11
SCV Electromagnetic Compatibility Chapter
Speaker: Dr. Keith Hardin, Lexmark International, Inc.
Time: Social at 5:30 PM; presentation at 6:30 PM
Cost: none
Place: Applied Materials Bowers Cafeteria, 3090 Bowers Ave., Santa Clara
RSVP: not required

Radiated and conducted emissions contain spectral and time domain information that can be very helpful in determining the sources of the emissions and possible countermeasures for information technology products. This presentation will discuss a number of methods to help analyze these emissions, show steps to move from the macro scale to the near field, and possible circuit changes to reduce the emissions.? The desire is to move from a trial and error solution method to one that is more deterministic when possible.

Dr. Keith Hardin is currently a Senior Technical Staff Member and Technical Team Leader in the EMC Department of Lexmark International, Inc. in Lexington, Kentucky. In this role, Keith is responsible for overseeing all technical aspects of Lexmark’s EMC product development and test activities. Keith received his M.Eng. and B.S. in Electrical Engineering from the University of Louisville. He received his Ph.D. in Electrical Engineering from the University of Kentucky.? He holds fourteen US patents in the field of Spread Spectrum Clock Generation and other areas of EMC.

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