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September 24, 2010

Mtg: Development and Application of Accelerated Test Methods Specific to CPV Systems

by @ 10:24 am. Filed under ALL, Electrical/Power, Electronics Design, Engineering Mgmt, Optics/Displays, Semiconductors
 

WEDNESDAY September 29, 2010
SCV Reliability Chapter
Speaker: Mark Spencer, Staff Reliability Engineer, SolFocus
Time: Social/refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Hewlett Packard Oak Room, Bldg 48, 1911 Pruneridge Ave, Cupertino
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/rl

SolFocus is currently involved in two separate accelerated test efforts to quantify the long term life of its SF1100 CPV (concentrator photovoltaic) product.? Results from these tests will be correlated with the ongoing monitoring of non-accelerated systems operating in the field, and the resulting relationships used to predict lifetime.? This paper details the accelerated test methodology used, presents some preliminary test results and links those results to standard operating conditions.
See also the Rel Chapter talk on October 27th, รข??HCPV Tracker Accelerated Reliability Tests???, for a continuation of this topic.

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