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June 12, 2011

Int’l Symposium for Testing and Failure Analysis

by @ 6:52 am. Filed under ALL, Electronics Design, Engineering Mgmt, NanoEngineering, Semiconductors
 

North America’s largest trade show of FA-related equipment and services
37th Int’l Symposium for Testing and Failure Analysis
— November 13-17, 2011 ? ? — San Jose Convention Center
— Sessions: Tues-Thurs, Nov 15-17 ? ? — Exposition: Tues-Wed, Nov 15-16
Theme: “Finding the Invisible Defect.” ? ISTFA’11 combines technical sessions, tutorials, an exhibition, and user group meetings with a focus on making the full experience a strong benefit for the attendee.
Sessions: ? – Packaging- and Assembly-Level FA ? – Defect Characterization & Metrology ? – FA Process/Case Histories ? – Sample Preparation ? – Alternative Energy ? – Photon-Based Techniques ? – Board and System Level FA ? – EMS, Discretes and Optoelectronic Device FA ? – and more, plus Panel Discussion, Poster Papers.
Also Tutorials, Short Courses, exhibits. ? Register by Sept 1 รข?? Save up to $180.
Registration now open … ? www.ISTFA.org

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