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August 24, 2011

Mtg: fcCuBE Technology: Expanding the Flip Chip Packaging Landscape

by @ 6:34 pm. Filed under ALL, Communications, Electronics Design, Engineering Mgmt, Semiconductors

WEDNESDAY September 14, 2011
SCV Components, Packaging and Manufacturing Technology Chapter
Speaker: Dr. Raj Pendse, VP & Chief Marketing Officer, STATSChipPAC Inc.
Time: Light buffet dinner at 6:00 PM; Presentation (no charge) at 6:45 PM
Cost: $20 if reserved by Sept 12; $10 for fulltime students and currently unemployed; $5 more at door
Place: Biltmore Hotel, 2151 Laurelwood Rd (Fwy 101 at Montague Expressway), Santa Clara
RSVP: from website

Flip Chip packaging has rapidly evolved into a mainstream solution for a wide range of Computing and Mobile products by virtue of the compelling benefits in performance and small form factors.? However, the continued adoption of flip chip technology presents several new challenges. The progressive increase in I/O density with new silicon (Si) nodes creates a widening gap between the escape routing density demanded by the Si device and the design rule roadmap for flip chip substrate technology.? Concomitantly, the higher current densities resulting from this I/O density trend bring into play new long term failure mechanisms such as Electromigration.? The trend towards Pb-free packaging necessitates bump and interconnect metallurgies that are mechanically damaging to the Si structure further exacerbated by the inherent fragility of the Si by virtue of the use of ELk/ULk (extra or ultra low k) dielectric materials in the newer Si nodes.? Last but not the least, the continued deployment of flip chip packaging across a broader range of applications requires that the cost structure be in line with incumbent solutions comprising gold (Au) and copper (Cu) wire bonded packages which use laminate or lead frame substrates.
fcCuBETM (flip chip with Cu column bump, BOL interconnection and Enhanced assembly processes) technology is a novel solution that systematically addresses the aforementioned challenges.? It features the use of Cu column bumps to address the demand of high Si I/O and current densities in conjunction with a proprietary BOL (Bump on Lead) interconnect structure.? The unique BOL structure enables remarkable improvement in escape routing density without stretching the substrate design rules while also achieving a dramatic reduction of mechanical stresses in the Si inner layers, thereby essentially eliminating the problem of damage to the Si structure.? By virtue of the BOL structure and enhanced assembly processes, notably including Mold Underfilling (MUF), a majority of cost-challenged applications can be packaged in low cost packages with 2-layer laminate substrates comparable in cost to incumbent wire bond solutions.
The key features of fcCuBE technology will be described in detail including the manufacturability and long term reliability of the package.? An analysis of the scalability of the approach into the future and the fit of the technology in the overall application space relative to other approaches such as Fan-in and Fan-out Wafer level Packaging.

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