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January 30, 2008

Mtg: Unique Testing For Products Containing TNV Circuits

by p.wesling @ 5:25 pm. Filed under ALL, Communications, Electronics Design, Engineering Mgmt, Semiconductors
 

TUESDAY February 26
SCV Product Safety Engineering Chapter
Speaker: Peter Tarver, Sanmina-SCI Corporation
Time: Optional dinner: 5:45 PM at El Torito; Presentation at 7:00 PM at Bowers Cafe
Cost: $5 for IEEE members, $10 for non-members
Place: Socialize at El Torito Mexican Restaurant, 2950 Lakeside Drive, Santa Clara; talk is at Applied Materials, Bowers Café, 3090 Bowers Ave, Santa Clara
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/pses

Does your equipment EVER connect to a Telecommunication Network? You think so? Youâ??re not sure?? Find out what NRTLs will expect you to do! Tonightâ??s â??advanced??? topic on TNV circuits covers:

  • TNV Limits
  • TNV effects on Touch Current and Earth Leakage Current
  • Reliable Earthing
  • Electrical Separation
  • Power Cross
  • Acoustic Pressure
  • RFT Circuits (if time allows)

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