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November 21, 2011

Mtg: Miniature Frequency-Extension Modules for Vector Network Analyzers

by @ 5:52 pm. Filed under ALL, Electronics Design, Engineering Mgmt, NanoEngineering, Semiconductors
 

THURSDAY December 8, 2011
SCV Microwave Theory and Techniques, with Instrumentation and Measurement Chapers
Speaker: Karam Noujeim, Ph.D., Microwave Measurements Division, Anritsu Co.
Time: Networking and refreshments at 6:00 PM; Presentation at 6:30 PM
Cost: none
Place: Agilent Technologies, Aristotle Room (Main Lobby), 5301 Stevens Creek Blvd, Santa Clara
RSVP: to Brian Lee, brian.lee@ieee.org

A detailed description of the high-frequency reflectometer technology deployed in Anritsuâ??s Vector Network Analyzer (VNA) family will be given.? It will be shown that scaling of this technology for use in the millimeter-wave range results in miniature frequency-extension modules that provide unique capabilities such as direct connection to wafer probes, dense multi-port measurements, test-port power leveling, enhanced raw directivity, and reduced measurement complexity when compared with existing solutions.? These capabilities, combined with the frequency-scalable nature of the extension modules provide users with unique and compelling solutions for their current and future high-frequency measurement needs.? Applications of this technology beyond traditional test and measurement will be described.

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