IEEE S.F. Bay Area Council e-GRID's
BayAreaTech

TUESDAY January 10, 2012
SCV Electromagnetic Compatibility Chapter
Speaker: Jari Vikstedt, ETS-Lindgren
Time: Networking/light dinner at 5:30 PM; Presentation at 6:30 PM
Cost: small fee for dinner
Place: Applied Materials Bowers Cafeteria, 3090 Bowers Ave., Santa Clara
RSVP: not required
Web: ewh.ieee.org/r6/scv/emc

This presentation provides a tutorial on Radiated Spurious Emissions (RSE) testing for wireless devices.? It will review the history of the test and provide details on how to perform the test in accordance with the applicable wireless standards.? The presentation will address chamber design and test requirements, as well as provide a review of the noise floor and pre-amp selection.? Tips on the notch filter required to perform this test will be provided. As a member of the ANSI C63® wireless working group addressing the new standard ANSI Standard C63.26 on compliance testing of licensed transmitters, the speaker will provide an update of current activity including the “pre-calibration” and “substitution” methods related to RSE testing.? The presentation will conclude with a helpful chart comparing performance requirements for the various Wi-Fi, CDMA, WCDMA, etc. standards.
Intended Audience: Novice and experienced wireless device design engineers and test technicians will appreciate this general, tutorial type presentation full of practical information and technical details, including “how to’s” and “gotcha’s” to look out for when performing the RSE test. In the wireless industry, TCB members (approvals), regulators, manufacturers and laboratories will especially benefit from attending this presentation.