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July 16, 2012

Mtg: Nanoscale Chemical Imaging of Energy Materials with Full-field Transmission X-ray Microscopy

by @ 6:53 am. Filed under ALL, BioEngineering, NanoEngineering, Optics/Displays, Semiconductors
 

TUESDAY July 17, 2012
SCV Nanotechnology Chapter
Speaker: Dr. Joy C. Andrews, SLAC National Accelerator Laboratory
Time: Registration & light lunch at 11:30 AM; Presentation at 12:00 Noon
Cost: IEEE Members and Students $5. Non-Members $10
Place: Texas Instruments Bldg E-1 CMA Room, 2900 Semiconductor Drive, Santa Clara
RSVP: from website
Web: www.ieee.org/nano

Correlation of chemistry and morphology in hierarchical functional materials such as battery electrodes, fuel cells and catalysts can drive design of more efficient materials.? Full-field nanoscale chemical imaging has been used to collect single-pixel XANES (~1E6 spectra per energy stack; acquired in minutes) at down to 30 nm resolution.? The full-field transmission X-ray microscope (TXM) on beam line 6-2 at the Stanford Synchrotron Radiation Lightsource combines large field of view (tens to hundreds of microns) with high resolution imaging from ~4.5 to 14 keV (delta-E/E < 1e-4), for XANES chemical speciation.? Custom software (TXM Wizard; available free for public use) is used to produce chemical and morphological maps of various composite systems in 2D and 3D.? In situ and ex situ results from full-field XANES microscopy of Li-ion battery electrodes and other catalytic materials, rendering insight into performance and structure, will be presented.

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