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October 1, 2013

Seminar: Soft Error Rate (SER) Workshop

by @ 3:20 pm. Filed under ALL, Communications, Computers/Software, Electronics Design, Engineering Mgmt, NanoEngineering, Semiconductors

THURSDAY October 24, 2013
SCV Components, Packaging and Manufacturing Technology, with Reliability and Electron Devices Chapters
Speakers: Mike Gordon, IBM TJ Watson Research Center; Prof. Blas Cabrera, Stanford University; Adrian Evans, iROC; Dinesh Maheshwari, Cypress Semiconductor; Ramya Ramarapu, Cisco Systems; Helmut Puchner, Cypress Semiconductor; Bharat Bhuva, Vanderbilt University; and several more
Time: Registration and demo’s at 10:30 AM; Presentations begin at 11:30 AM; Lunch break at 12:20 PM; finish at 5:00 PM
Cost: none
Place: Cisco, Building 15, 3750 Cisco Way, San Jose, and live on the Web
RSVP: from website

The 5th annual IEEE Santa Clara Valley SER Workshop provides a unique forum for component manufacturers, assembly houses, and electronic system manufacturers to exchange innovative ideas and recent results on the measurement, monitoring, and control of alpha emission from packaging materials and manufacturing processes. Built on the success of our workshops held in 2009 through 2012 (with over 100 attendees), this year’s event continues to cover a wide range of areas and subjects critical to the control and mitigation of device soft error rates. Talks will cover the newest updates and advances for a wide range of areas including alpha emissivity measurement techniques and processes and impact on advanced low-k devices. Speakers will come from equipment makers, component manufacturers, and academic institutions. Sign up early!


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