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December 9, 2013

Mtg: The Impact of Cables and Connectors on Radio Frequency and Microwave Measurement Uncertainties

by @ 11:20 am. Filed under ALL, Communications, Electronics Design, Engineering Mgmt
 

TUESDAY January 14, 2013
SCV Electromagnetic Compatibility Chapter
Speaker: Dennis Lewis, Boeing
Time: Networking and light dinner (small fee) at 5:30 PM; Presentation at 6:30 PM
Cost: none, for talk
Place: Agilent Technologies, Bldg. 5L, 5301 Stevens Creek Blvd, Santa Clara
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/emc

Microwave test and measurement equipment is used for many applications, including component measurements, electromagnetic compatibility testing, metrology and wireless environment assessments.  Much of this equipment requires special care and consideration in order to eliminate damage and maintain a high level of accuracy.  When developing these high frequency measurement systems and evaluating system performance, it is common to consider the warranted equipment specifications.  Very often, however, the error contribution of cables and connectors to the system uncertainty is overlooked. Impedance mismatch is typically the largest source of measurement error and is largely influenced by the cables and connectors used within the system.  Something as insignificant  as a $30 connector can adversely affect the performance of a system costing several hundred thousand dollars.  This presentation provides an overview of commonly used cables and connectors and discusses some of the errors associated with them.  The impact of these errors on overall measurement system uncertainties is discussed.  The presentation finishes with some practical examples and real world applications to help guide participants in the selection and use of cables and connectors and more accurately assess system performance.

20140114scv

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