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April 27, 2008

Mtg: Advancements in Noise Measurement

by @ 7:31 pm. Filed under ALL, Communications, Electronics Design, Engineering Mgmt, Semiconductors
 

WEDNESDAY May 21
SCV Instrumentation and Measurement Chapter
Speaker: Ken Wong, Agilent Technology
Time: Social/refreshments at 6:30, Presentation at 6:45 PM
Cost: none
Place: Board Room, Cogswell College, (1175 Bordeaux Dr, Sunnyvale
RSVP: by email to Brian Lee, Brian.Lee@IEEE.ORG
Web: ewh.ieee.org/r6/scv/ims

 

Noise measurements were developed since the beginning of telecommunication. ? The Y-factor method was introduced back in the 1930’s.? The cold source method was also mentioned at the same time. Noise parameters were defined in the late 1950’s and at about the same time, the noise wave concept was also introduced as an alternative amplifier noise model.? The significance of noise wave wasn’t noticed until the mid 1960’s for amplifier network analysis.? Since then, numerous measurement methods of noise parameters and noise wave were proposed. Refinements to the Y-factor methods were also made. ? However, no commercial noise wave measurement system was available until recently.

This presentation will present an overview of the noise measurement methods and show their relationships. ? The new noise wave measurement system, that provides full mismatch corrected noise figure measurements, will be discussed.

 

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