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January 30, 2014

Mtg: Measuring Dielectric Constant with a Microstrip Ring Resonator

by @ 3:58 pm. Filed under ALL, Communications, Electronics Design, Semiconductors
 

THURSDAY February 13, 2014
SCV Microwave Theory and Techniques Chapter
– solder mask, loss, technique …
Speaker: Jeff Philips, TCI
Time: Networking and refreshments at 6:30 PM; Presentation at 6:30 PM
Cost: none
Place: Agilent Technologies, 5301 Stevens Creek Blvd, Santa Clara
RSVP: not required
Web: meetings.vtools.ieee.org/meeting_view/list_meeting/23265

Thereâ??s no point in modeling RF and microwave circuitry without an accurate microstrip substrate definition and specifically without an accurate dielectric constant.  Historically, thereâ??s been some confusion about the dielectric constant of Rogersâ?? 4003 material.  Solder mask is often cleared over critical portions of microstrip circuitry on RF and microwave PCBs to perfectly mimic the microstrip definition.  Instead of covering the copper with solder mask, it is often covered with the popular ENIG PCB finish.  Does the nickel in the ENIG PCB finish create unacceptable loss?  If it does, could critical circuitry instead be covered with solder masks like the popular Taiyo PSR-4000 BN Series?  Does solder mask change the effective dielectric constant?  These questions will be discussed.  Also, a microstrip ring resonator technique to measure dielectric constant will be introduced.  Measurements of dielectric constant with 0-, 1-, and 2-mil solder mask thicknesses on the Rogers 4003 material will be presented.  The discussion focuses on PCB design, but the concepts and techniques might be applicable to IC design as well.

20140213scv

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