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November 13, 2014

Mtg: Quality of PV Modules Around the World: Qualification Testing Failure Rate Results from China, Germany, India, Japan, Korea and US

by @ 1:51 pm. Filed under ALL, Electrical/Power, Electronics Design, Optics/Displays, Semiconductors
 

Wednesday December 10, 2014
SCV Photovoltaics Chapter
– unqualified materials, warranty rate, recall history, design evolution …
Speakers: Matthias Heinze, Director Business Development, Global Business Field at TUV Rheinland
Time: Networking and refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Palo Alto Research Center (G.E. Pake Auditorium), 3333 Coyote Hill Road, Palo Alto
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/pv

Qualification testing of photovoltaic modules, according to IEC 61215 or IEC 61646 standard, is generally considered as a minimum requirement for reliability. Between 2011 and 2013, there was immense price pressure on PV module manufacturers; this price pressure has steered many manufacturers to cutting corners with poor quality materials or introducing unqualified materials. These changes in the module design and materials could increase the warranty claim rate and shatter the traditional minimal recall history of PV modules. This presentation analyzes the influence of these material changes on the crystalline silicon module design quality from two perspectives: (i) Design variation between regions; and (ii) Design evolution over 16 years. The analysis presented is based on test results obtained on several thousands of modules in the six regional labs of TÃ?V Rheinland around the world.

20141210scv

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