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September 17, 2015

One-Day Soft Error Rate (SER) Workshop

by @ 3:04 pm. Filed under ALL, Computers/Software, Semiconductors
 

October 15, 2015 
SCV Components, Packaging, and Manufacturing Technologies (CPMT), with Reliability, Electron Devices Chapters 
Subject: One-Day Soft Error Rate (SER) Workshop 
– measurement, monitoring, and control of alpha emission from packaging materials and manufacturing processes. 9 speakers, panel. …
Speakers: Pierre Maillard, Xilinx; Ken O’Neill, Microsemi; Paolo Rech, Federal University of Rio Grande do Sul; Mike Gordon, IBM; Norbert Seifert, Intel; Paolo Privitera, University of Chicago; Charlie Slayman, Cisco Systems
Time: 8:30 am to 3:00 pm 
Cost: Free, and includes lunch, coffee breaks 
Location: Live on the Internet, and on-site at Juniper Networks, 1194 N. Mathilda Ave, Sunnyvale
Event Details: www.cpmt.org/scv/meetings/cpmt1510w.html

20151015ALL

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