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November 9, 2015

Designed to Fail? Exploring Product Reliability Using JMP Pro

by @ 11:27 pm. Filed under ALL, Computers/Software, Electronics Design, Reliability
 

Thursday, December 3, 2015 
SCV Reliability Society 
Subject: Designed to Fail? Exploring Product Reliability Using JMP Pro
– Uncovering vulnerable components inside a system and accurately making predictions on both individual components and complete systems, design alternatives into quantitative decisions… 
Speaker: Laura A. Higgins, Ph.D, Sr. Systems Engineer, JMP, SAS Institute 
Time: 6:00 pm: Registration, refreshments, networking; 6:30 pm to 7:30 pm: Presentation and Q&A 
Cost: Free; Food sponsored by ICE Labs, ISO 9001 & 17025 Reliability Test Lab. www.icenginc.com 
Location: Qualcomm, Inc. (Building-B Cafeteria), 3165 Kifer Road, Santa Clara 
Event Details: https://www.eventbrite.com/e/designed-to-fail-exploring-product-reliability-using-jmp-pro-tickets-19487994115

20151203ALL

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