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January 29, 2016

Nanoscale Chemical Imaging with Photo-induced Force Microscopy

by @ 2:15 pm. Filed under ALL, NanoEngineering, Photonics
 

Tuesday, February 16, 2016 
SFBA Nanotechnology Council 
Subject: Nanoscale Chemical Imaging with Photo-induced Force Microscopy
– PiFM acquires both the topography and spectral images concurrently and naturally provides information on the relationship between local chemistry and topology.. 
Speaker: Dr. Thomas Albrech, Molecular Vista 
Time: 11:30 am: Networking, pizza & drinks; 12:00 noon to 1 pm: Presentation 
Cost: $5 donation for lunch 
Location: Texas Instruments, Building E Conference Center, 2900 Semiconductor Dr., Santa Clara 
Event Details: http://sites.ieee.org/sfbanana/

20160216ALL

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