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September 23, 2008

Mtg: Soft Errors – No Way To Escape

by @ 12:59 pm. Filed under ALL, Communications, Computers/Software, NanoEngineering, Semiconductors

TUESDAY October 14, 2008
SCV Electron Devices Chapter
Speaker: Dr. Helmut Puchner, Cypress Semiconductor
Time: Social at 6:15 PM; Presentation at 6:30 PM
Cost: none
Place: National Semiconductor, Building E-1, Conference Center, Santa Clara
RSVP: not required

Continuous technology scaling has led to cosmic ray induced soft errors becoming a major threat to modern semiconductor devices. ? This talk will cover the fundamentals of soft errors, their sources in common semiconductors as well as the different available mitigation techniques.

Soft Errors gained a lot of attention since the mid 90’s when contaminated packaging material caused massive device failures. ? Since then a lot of improvements have mitigated most of the alpha particle related soft errors. ? Due to continuous technology scaling, however, cosmic ray induced soft errors have gained significantly and are nowadays the major threat to modern semiconductor devices. Most vulnerable are SRAM devices, since they operate at high speed and relatively low storage node charges. ? We will present the fundamentals of soft errors, their sources in common semiconductors as well as the different available mitigation techniques.

Every attendee will receive a free copy of “Soft Errors – History, Trends and Challenges” published by J.Ziegler and H.Puchner.

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