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August 30, 2016

Metrology in Nanotechnology

by @ 2:42 pm. Filed under ALL, NanoEngineering
 

Tuesday, October 18, 2016
SFBA Nanotechnology Chapter
Subject: Metrology in Nanotechnology
– A review of new metrology tools and their applications in nanotechnology …
Speaker: Dr. Min Yang, Director of Applications Development, Bruker Nano Surfaces
Time: 11:30 am: Networking, pizza & drinks; 12:00 noon to 1 pm: Seminar
Location: Texas Instruments, Building E Conference Center, 2900 Semiconductor Dr., Santa Clara
Event Details: https://www.eventbrite.com/e/metrology-in-nanotechnology-tickets-27364078696

 

Chapter website: http://sites.ieee.org/sfbanano/



20161018ALL

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