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October 12, 2008

Conf: Int’l Symp for Testing and Failure Analysis

by @ 5:07 pm. Filed under ALL, Electronics Design, Engineering Mgmt, Optics/Displays, Semiconductors
 

34th International Symposium for Testing and Failure Analysis
— November 2-6, 2008 — Oregon Convention Center, Portland
— Pre-conference Short Courses — 14 Educational Tutorials
— 18 Technical Sessions — Exposition — User Groups
ISTFA is the best venue for learning new failure analysis techniques, challenges and directions. It provides ample opportunities for you to participate and network through the Q&A periods, the user groups, the panel discussions, and the exhibition.
Sessions: – Emerging Concepts – Failure Analysis Process – Package and Assembly Level FA – Circuit-Edit – Sample Preparation â?¢ Photon Based Techniques – Scanned Probe Microscopy – System Level Failure Analysis – Test – Nanoprobing – Yield Enhancement – Metrology
For information and to register: www.ISTFA.org

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