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April 13, 2017

Ten Years of Robustness Validation Applied to Power Electronics Components

by @ 11:27 am. Filed under ALL, Electrical/Power, Reliability, Semiconductors
 

Thursday, April 27, 2017
SCV Components, Packaging, and Manufacturing Technologies (CPMT), Reliability, and Power Electronics Chapters
Subject: Ten Years of Robustness Validation Applied to Power Electronics Components
– European car makers, physics of failure, “test to fail”, end-of-life testing, thick wire bonds, planar interconnects…
Speaker: Dr Eckhard Wolfgang, European Center for Power Electronics e.V. (retired from Siemens Research)
Time: 11:30 am: Registration, networking, and pizza & drinks; 12:00 pm to 1:00 pm: Presentation; If coming for presentation only: arrive at 11:45
Cost: IEEE members students, unemployed: $5; Non-members: $10; Add an additional $5 at door
Location: Texas Instruments Building E Conference Center, 2900 Semiconductor Dr, Santa Clara
Event Details: http://www.cpmt.org/scv/

20160427ALL

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