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April 3, 2018

Near-Field Scanning : Searching for Root Causes

by @ 5:45 pm. Filed under ALL, Magnetics
 

Thursday, April 10, 2018 
SCV ElecroMagnetic Compatibility (EMC) Chapter 
Subject: Near-Field Scanning : Searching for Root Causes
– Emission source microscopy (ESM) scanning technology is a powerful tool to identify the radiated emission sources, measurement is performed in “radiative” near-field (Fresnel) region … 
Speaker: Hamed Kajbaf, Amber Precision Instruments 
Time: 5:30 pm: Networking and light dinner; 6:30 pm: Presentation; 7:45 pm: Adjourn
Cost: Water and soft drinks are free. Food is available for a small fee.
Location: 7layers, 1293 Anvilwood Ave., Sunnyvale 
Event Details: ewh.ieee.org/r6/scv/emc/ 

20180410ALL

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