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January 30, 2009

Mtg: Best of RAMS — the Reliability and Maintainability Symposium

by @ 9:44 am. Filed under ALL, Communications, Computers/Software, Electronics Design, Engineering Mgmt, Semiconductors
 

WEDNESDAY February 25, 2009
SCV Reliability Chapter
Speakers: Chapter members who attended
Time: Refreshments at 6:30 PM; Presentations at 7:00 PM
Cost: none
Place: HP Oak Room, 19447 Pruneridge Avenue (Building 48), Cupertino
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/rl

The 55th Annual Reliability and Maintainability Symposium (RAMS) was held in Fort Worth on January 26-29, 2009. For those of you that couldn’t attend, we will bring the symposium to you (except for the Texas accents). This evening offers highlights of the best papers presented at RAMS during this 4 day event. The theme of this yearâ??s RAMS was â??Reliability as a Competitive Advantage: From Theory to Practice???. Information on RAMS is available on the web at http://www.rams.org/. The panel is being organized by Mike Silverman. If you are interested in helping select papers, being on the panel, leading a discussion, or contributing in another way, please e-mail us at reliability@ieee.org.

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